Use of the Lateral photo effect to study sample quality in GaAs/AlxGa1 xAs heterostructures
TitleUse of the Lateral photo effect to study sample quality in GaAs/AlxGa1 xAs heterostructures
Publication TypeArtikel in tijdschrift
Year of Publication1988
JournalAppl. Phys.
Volume64
Pagination3085-3088
AuthorsFontein, P.F., Hendriks, P., Wolter, J.H., Peat, R., Williams, D.E., & Andre, J.-P.